Mike making a fine adjustment to the thin film
spectrometer.
Our main purpose is to educate students, undergraduate
and graduate, in a facility which examines "real world" problems using
state-of-the-art equipment. A few examples would be, identifying surface
defects (metal processing & jewelry industry), identifying surface
contaminants (metal processing, jewelry & semiconductor industry),
performing chemical analysis on bulk materials and thin films for local
industry.
The Thin Film Surface Characterization Laboratory
is equipped with a Perkin Elmer 5500 Multitechnique Surface Analyzer. This
remarkable system incorporates three separate analytical techniques within
one machine:
-
Auger Electron Spectroscopy (AES)
-
Electron Spectroscopy for Chemical Analysis (ESCA)
-
Secondary Ion Mass Spectroscopy (SIMS).
This system is also equipped with a scanning electron
microscope (SEM), to visually identify the areas to be analyzed, and an
argon ion gun that is used for performing depth profiles.
In addition to this instrument, the laboratory is equipped
with an Atomic Force Microscope, a Scanning Electron Microscope with EDS
and X-ray diffractometer. The laboratory is set up to work with clients
on a contractual basis and\or at an hourly rate. Work can be performed
at a proprietary level. Standard turnaround time on most projects is within
48 hours.
Mail can be sent to platek@ele.uri.edu
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