7th IEEE North Atlantic Test Workshop
University of Rhode Island W. Alton Jones Campus
West Greenwich, RI USA
May 28 - May 29, 1998
`Reliability and Testing Issues for the 21st Century'

Call For Papers

The IEEE North Atlantic Test Workshop provides a forum for discussions
on the latest issues relating to higher quality, more economical, and
more efficient testing methodologies and designs. The 7th workshop
will focus on `Reliability and Testing Issues for the 21st Century'.
The major topics include, but are not limited to, the following:
 Analog Circuit Testing
 Hierarchical Test Generation
 Automatic Test Generation
 High Frequency Test
 Built-In Self Test (BIST)
 IDDQ Testing
 Card / Board Testing
 MCM Testing
 Delay Testing
 Mixed Signal Test
 Design for Testability
 Reliability
 Design Verification
 On-Line Testing
 Economics of Test
 Self-Checking Circuits
 Embedded Core Testing
 Synthesis for Testability
 Fault Modeling and Diagnostics
 System Testing
 Fault Simulation
 Testing Philosophies

The Program Committee invites authors to submit paper proposals and
panel proposals. Papers may be extended summaries or full papers.
Clearly describe the nature of the work, explain its significance,
highlight novel features, and describe its current status. On the
title page, please indicate: title, name and affiliations of all
authors, an abstract of 50 words, and suggested topics. Also identify
a contact author and include a complete mailing address, phone number,
fax number, and email address. Submit three copies of proposals by mail
or a postscript version via email. Submissions are due no later than
2/1/98. Based upon acceptance, camera-ready submissions for inclusion
in a digest must be submitted by 4/15/98.

For general information, contact:    Submit paper proposals to:
James A. Monzel, General Chair       Karen P. Lentz, Program Chair
IBM Corp. Z/863H                     Tufts University
1000 River St.                       161 College Ave.
Essex Junction, VT 05452             Medford, MA 02155
phone: 802-769-6428                  phone: 617-628-5000 x5976
fax: 802-769-7509                    fax: 617-627-3220
email: jmonzel@vnet.ibm.com          email: karen@eecs.tufts.edu

To view this call for papers on-line and see other information
regarding this workshop, visit our home page. The URL is
http://www.ele.uri.edu/natw98

The 1998 North Atlantic Test Workshop is sponsored by the IEEE
Computer Society Test Technology Technical Committee and the
University of Rhode Island.

General Chair: James A. Monzel-IBM
Program Chair: Karen P. Lentz-Tufts University
Vice-General Chair: J. C. Lo-University of Rhode Island
Vice-Program Chair: Stephan Athan-University of South Florida
Finance and Registration: E. S. Cooley-Dartmouth College
Publications: Jim Daly-University of Rhode Island
Past Chair: Jake Karrfalt-ASC Inc.
Program Committee:
J. Armstrong-Virginia Tech
R. I. Bahar-Brown University
S. Banerjee-Lucent Technologies
C. Baron-INSAT
S. Bhawmik-Lucent Technologies
K. Chakrabarty-Boston University
X. Chen-IBM
R. Davies-DEC
P. Delvy-DEC
N. Jha-Princeton University
B. Kaminska-OPMAXX Inc.
Z. Navabi-Northeastern University
P. Nigh-IBM
B. Ravikumar-University of Rhode Island
P. Song-IBM
J. Tellier-Microsim