ELE540 Electronic Testing I: Foundation (3 or 4 credits)
Design verification, product testing and quality assessment of digital, analog and mixed signal devices at chip and board levels. Defect and fault modeling, test vector generation, scan designs, design-for-testability, IEEE 1149.X (boundary scan) and built-in self test (BIST).ELE541 Electronic Testing II: Physics and Instruments (4 credits)
Advanced topics in electronic testing. Chip structures, current testing, thermal testing, unpowered testing, low voltage testing, noise, test synthesis, bench testing and automated test equipment (ATE). Students design and demonstrate a semiconductor production test system using ATE.