Title:   IDDQ Testing with Adaptive Threshold
Authors: Seok-Bum Ko and *J.C. Lo, URI
Contact: jcl@ele.uri.edu

Abstract:
We examine here the adaptive methods for IDDQ testing where the PASS window, a
range of acceptable IDDQ measurements, is dynamically determined. The size of
this window, or the range, can be either a user defined constant, or a linear
relation (percentage). In this paper, we examine these adaptive methods using
the SEMATECH data set. Our results show that both approaches can provide decent
outcomes in the sense that 20-30% of previously IDDQ fail-only dies (in wafer
sort) can pass the new test procedures. Many of these dies are tested defect-
free after packageing and/or burn-in according to the SEMATECH data.