Title:   A New Scan Structure for Improved Scan Chain Diagnosis and Delay 
         Fault Coverage
Authors: *Peilin Song, IBM-Poughkeepsie NY
Contact: psong@us.ibm.com

Abstract:
It  is well known that diagnosing the broken scan chain of a full scan
design is very difficult without changing the scan structure. Another
problem of a full scan design is lack of delay fault coverage due to
its latch adjacency nature.  In this paper, a new scan configuration is
proposed for improving the scan chain diagnostics and delay fault coverage.