Title:   Self Test Architecture for Testing Complex Memory Structures
Authors: *Kamran Zarrineth, Thomas Eckenrode, Steven Gregor, IBM-Endicott, NY
         R. Dean Adams, IBM-Burlington, VT
Contact: zarrineth@us.ibm.com

Abstract:
The structural complexity and test challenges of complex dependent
memory structures are described.  A novel programmable memory BIST
architecture to realize a set of custom memory test algorithms has
been designed and developed.  The proposed memory BIST architecture
can be used to test the dependent memory structures in different
stages of their design and fabrication. The experimental results
demonstrate the area overhead of different components of the
proposed programmable memory BIST architecture.