Title:   Serial Data Compression for 1149.1 Compatible Core Testing
Authors: *Zainalavedin Navabi and Farzin Karimi, Northeastern Univ.
Contact: navabi@ece.neu.edu

Abstract:
We describe a test data compression technique compatible with IEEE 1149.1
that applies well to core testing. This technique takes advantage of
repeated patterns in parallel test data. The decompression hardware is
fully compatible with the IEEE standard and requires special scan
registers and additional instructions.