Title: Effective Parallel Processing Techniques for The Generation of
       Test Data for Logic Built-in Self Test System
Authors: *Paul Chang, Intel Corp., Austin, TX
Contact: paul.h.chang@intel.com

Abstract:
Logic Built-in Self Test (LBIST) is a test methodology adopted for some
companies in their high end processor designs. It involves very high
volume of simulation patterns, usually in the neighborhood of million
patterns. For large designs, the simulation time, including logic
simulation, random stimulus generation and signature computations, can
be prohibitive. Parallel processing provides a relief for the high
simulation time caused by high simulation patterns. This paper
describes a technique to efficiently partition simulation patterns
derived from on-product PRPGs among different processors and an innovative
post cycling technique for the collection of signatures computed in parallel
among different processors. The results demonstrate that correct signatures
are generated with very good speed up in LBIST simulation time.