The 6th IEEE North Atlantic Test Workshop

May 29 - May 30, 1997, West Greenwich, Rhode Island

Sponsored by the IEEE Computer Society , Test Technology Technical Committee.


The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to higher quality, more economical, and more efficient testing methodologies and designs. The 6th workshop will focus on `Quality Designs and Tools for the 21st Century'.

This year's workshop will open with a keynote talk by Don McInnis, CEO of SpeedSim Inc. Don's talk will discuss Business Issues Facing Test and EDA Tool Development and will give us an outlook on the future of CAD tools and the challenges ahead. We are also pleased to announce the inclusion of an invited paper on Embedded DRAM Technologies and the test implications involved; to be presented by a team of leading DRAM technologists from IBM Microelectronics. The one and one-half days of technical paper presentations will also include the following interesting topics: BIST, ATPG, MCM testing, Fault Simulation, Testing Systems-on-a-Chip, Yield Prediction, Delay Testing, Memory Testing, Circuit Simulation, and IDDQ test approaches.

The 1997 workshop will be held at the Whispering Pines Conference Center, located on the W. Alton Jones Campus of the University of Rhode Island. URI's W. Alton Jones Campus is situated on 2,300 acres of pristine forest, streams, ponds, a 75 acre lake, and a nineteenth-century farm. The campus adjoins the 40,000 acre Arcadia and Pachaug State Forests. It is a 30 minutes drive from Providence, RI, a 1 hour and 30 minutes drive from Boston, MA or Hartford, CT, and a 3 hours drive from New York City

For more information, contact Jim Monzel, Tel: (802)-769-6428, Fax: (802)-769-7509, e-mail: jmonzel@vnet.ibm.com or natw97@ele.uri.edu, WWW: http://www.ele.uri.edu/natw97


ADVANCED PROGRAM:

Advanced program of NATW'97 is now available in either ASCII format or Postscript format.


REGISTRATION and HOTEL INFORMATION

Workshop registration and hotel information are now available in either ASCII format or Postscript format.


AUTHOR SCHEDULE:

Submission due:                               Febuary 1, 1997
Final camera-ready manuscripts due:            April 15, 1997

ABOUT The Conference Site:

The 6th North Atlantic Test Workshop will be held at W. Alton Jones Campus in West Greenwich, RI and hosted by the Department of Electrical and Computer Engineering , University of Rhode Island , Kingston, RI. For detailed information and driving direction, please visit the homepage of W. Alton Jones Campus of URI.


Please email comments or questions to natw97@ele.uri.edu