1.3 - Automated Test Data Generation for Architecture Validation
      of a Processor's Instruction Set

Authors: Aravind Manogar, M. Murali Babu, Sunil Nanda and V. P. Haneefa
Univ/Comp: Software and Silicon Systems (India)
Presenter: M. Murali Babu - murali@prithvi.siliconsystems.co.in

******** Abstract:
Test data generation for validation is the process of identifying
program-input data which satisfy selected test criteria. Automatic
test data generation involves symbolic evaluation of program parameters.
However, for most of the practical programs this involves evaluation of
complex algebraic expressions. In this paper, we present a systematic
approach to test data generation which involves solving constraints for
a particular chosen path in the program on a sub goal basis by using
inverse operators, leading to a significant speed up of the test data
generation.