2.3 - An Automatic Test Generation Algorithm for Functional Testing at
      Register Transfer Language Level

Authors: Steve Su
Univ/Comp: SUNY-Binghamton
Presenter: Steve Su - stevesu@binghamton.edu

******** Abstract:
With the advance of integrated technology into ULSI (Ultra LArge Scale
Integration), functional test generation is a must since it can reduce
test generation time by several order of magnitude. In this presentation,
the register transfer language (RTL) level fault model is defined. Based
on the model, we present an algorithm for generating tests for detecting
functional faults in digital systems. The algorithm has important
applications in automatic test gpattern generation, redundancy
identification, delay and timing analysis, fault coverage at the
functional level (for comparing it with the gate level) and RTL testability
analysis.