3.2 - Diagnosing Interconnects of Random Access Memories

Authors: J. Zhao, F. J. Meyer and F. Lombardi
Univ/Comp: Northeastern Univ.
Presenter: F. Lombardi - lombardi@ece.neu.edu

******** Abstract:
This paper presents an approach for the maximal diagnosis of all faults
(stuck-at, open and short) in the interconnect of a random access memory
(RAM); the interconnect includes data and address lines. This approach
accomplishes maximal diagnosis under a complex model in which the lines
in the interconnect of the RAM are involved in multiple faults
simultaneously. Maximal diagnosis consists of detection and location of
all diagnosable faults as well as type identification of multiple faults
affecting each line (for example the diagnosis of open faults is possible
based on the assumption that these faults behave as stuck-at faults).