3.4 - High Resolution Diagnostic Techniques for the IBM S/390 Microprocessor

Authors: Peilin Song, Franco Motika, Mary Kusko, Rick Rizzolo, Julie Lee
         and Robert Clairmont
Univ/Comp: IBM
Presenter: Peilin Song - psong@us.ibm.com

******** Abstract:
Understanding the root causes of chip failure is the key to improving yield
and reliability. To ensure rapid improvements, quick turn around time and
high success rate through the diagnostic/physical failure analysis (PFA)
path is necessary. This paper describes how tester-based diagnostic
techniques combined with  circuit  fault simulation techniques were used in
the hardware bring-up of  the IBM S/390 G5 CMOS microprocessor and the
associated cache chips.