5.1 - Reconvergent Fanout Removel Through Partial BIST Insertion

Authors: Ian G. Harris
Univ/Comp: U. Mass. at Amherst
Presenter: Ian G. Harris - harris@solymar.ecs.umass.edu

******** Abstract:
The chief goal of partial scan/BIST selection is to identify the
minimum number of flip flops in a design which can be converted into
test flip flops to enable high fault coverage. We propose the
elimination of reconvergent fanout during partial scan/BIST selection
by choosing flip flops on reconvergent fanout paths. We present a
partial scan/BIST selection algorithm which minimizes reconvergent
fanout. Experimental results show the significant fault coverage
gain enabled by this approach.